[dpdk-dev] [PATCH] app/test: Removed vdev test in EAL flags unit test

[Pablo de Lara]

From: Pablo de Lara <pablo.de.lara.guarch at intel.com>

In whitelist test, within EAL flags unit test, vdev flag
was being tested, but test fails, as a secondary process
cannot allocate memzones, so it cannot create the device
and application exits. Also, this can be tested in ring
pmd test, which needs vdev and not in whitelist, which
should only test --pci-whitelist.

Patch "app/test: fix build switches to enable cmdline tests"
from Thomas Monjalon is needed for this patch.

Signed-off-by: Pablo de Lara <pablo.de.lara.guarch at intel.com>
---
 app/test/test_eal_flags.c |    4 ----
 1 files changed, 0 insertions(+), 4 deletions(-)

diff --git a/app/test/test_eal_flags.c b/app/test/test_eal_flags.c
index 1b80b80..7c6656b 100644
--- a/app/test/test_eal_flags.c
+++ b/app/test/test_eal_flags.c
@@ -58,7 +58,6 @@
 #define no_huge "--no-huge"
 #define no_shconf "--no-shconf"
 #define pci_whitelist "--pci-whitelist"
-#define vdev "--vdev"
 #define memtest "memtest"
 #define memtest1 "memtest1"
 #define memtest2 "memtest2"
@@ -317,9 +316,6 @@ test_whitelist_flag(void)
 	const char *wlval3[] = {prgname, prefix, mp_flag, "-n", "1", "-c", "1",
 			pci_whitelist, "09:0B.3,type=test",
 			pci_whitelist, "08:00.1,type=normal",
-#ifdef RTE_LIBRTE_PMD_RING
-			vdev, "eth_ring,arg=test",
-#endif
 	};
 
 	for (i = 0; i < sizeof(wlinval) / sizeof(wlinval[0]); i++) {
-- 
1.7.0.7