[dpdk-dev] [PATCH v8 2/9] test: add basic bus infrastructure tests
shreyansh.jain at nxp.com
Wed Jan 18 07:56:21 CET 2017
> -----Original Message-----
> From: Shreyansh Jain
> Sent: Wednesday, January 18, 2017 10:42 AM
> To: 'Thomas Monjalon' <thomas.monjalon at 6wind.com>
> Cc: dev at dpdk.org
> Subject: RE: [PATCH v8 2/9] test: add basic bus infrastructure tests
> > -----Original Message-----
> > From: Thomas Monjalon [mailto:thomas.monjalon at 6wind.com]
> > Sent: Wednesday, January 18, 2017 4:54 AM
> > To: Shreyansh Jain <shreyansh.jain at nxp.com>
> > Cc: dev at dpdk.org
> > Subject: Re: [PATCH v8 2/9] test: add basic bus infrastructure tests
> > 2017-01-17 19:07, Shreyansh Jain:
> > > +REGISTER_TEST_COMMAND(bus_autotest, test_bus);
> > You should add it to app/test/autotest_data.py
> Ok. I will do that.
> > > +/* Bus list exposed */
> > > +extern struct rte_bus_list rte_bus_list;
> > I think it should be possible to write a test without the real list
> > of registered bus.
> Yes, it is possible. I just modeled it on test_pci assuming that is a kind of
> expected/standard. But, it seems probably it is not. I will change the tests.
After sending out this mail I realized the real reason for using the actual lists. Functions like rte_eal_pci_register (for PCI) or rte_bus_register (for Bus), use global lists for registration. Test cases calls these functions for registering dummy device/bus.
One way is to not worry about adding these test/dummy devices/buses to original list as they would be unregistered anyway. But, risk is of impacting running list assuming multiple cases need to be run from same application/binary context.
Another way is to rewrite these functions locally in test case, but that also means not testing these global registration/de-registration functions.
Former method would continue to have symbols exported. Later is not testing some entry/exit functions of a sub-system.
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