[dpdk-dev] [PATCH] test: reduce test duration for efd autotest
Pattan, Reshma
reshma.pattan at intel.com
Wed Oct 17 15:33:24 CEST 2018
> -----Original Message-----
> From: Parthasarathy, JananeeX M
> Sent: Wednesday, September 26, 2018 3:19 PM
> To: dev at dpdk.org
>
> struct rte_efd_table *handle = NULL;
> uint32_t num_rules_in = TABLE_SIZE;
> - uint8_t simple_key[EFD_TEST_KEY_LEN];
You need to remove EFD_TEST_KEY_LEN macro from the code now, as it is not is not used now.
Also seems like they want to use the key of length 8 bytes as per this test.
But after your changes we are going to have one byte key , so is the test behaving same before and after this key change?
> + val = mrand48() & VALUE_BITMASK;
Can we use rte_rand() here instead of mrand48()?
What was the reason for using mrand8()?
Thanks,
Reshma
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