[dpdk-dev] [PATCH v2 2/3] test/efd: enable unit test compilation always
Dharmik Thakkar
dharmik.thakkar at arm.com
Wed Feb 20 23:47:13 CET 2019
This patch enables compilation of print_key_info() always using
log-level based approach instead of a macro. Need to set efd log type
to debug to print debug information, using the following eal parameter:
--log-type=efd,8
Change-Id: I5ca3a943ac0d0de16ca4a9fe36f370b1dc5c6015
Suggested-by: Thomas Monjalon <thomas at monjalon.net>
Signed-off-by: Dharmik Thakkar <dharmik.thakkar at arm.com>
Reviewed-by: Honnappa Nagarahalli <honnappa.nagarahalli at arm.com>
Reviewed-by: Gavin Hu <gavin.hu at arm.com>
Reviewed-by: Phil Yang <phil.yang at arm.com>
Reviewed-by: Ferruh Yigit <ferruh.yigit at intel.com>
---
v2:
* Add Reviewed-by tag
---
test/test/test_efd.c | 24 ++++++++----------------
1 file changed, 8 insertions(+), 16 deletions(-)
diff --git a/test/test/test_efd.c b/test/test/test_efd.c
index ced091aab63d..3b6f9db13565 100644
--- a/test/test/test_efd.c
+++ b/test/test/test_efd.c
@@ -34,28 +34,20 @@ struct flow_key {
/*
* Print out result of unit test efd operation.
*/
-#if defined(UNIT_TEST_EFD_VERBOSE)
-
static void print_key_info(const char *msg, const struct flow_key *key,
efd_value_t val)
{
- const uint8_t *p = (const uint8_t *) key;
- unsigned int i;
+ if (rte_log_get_level(RTE_LOGTYPE_EFD) == RTE_LOG_DEBUG) {
+ const uint8_t *p = (const uint8_t *) key;
+ unsigned int i;
- printf("%s key:0x", msg);
- for (i = 0; i < sizeof(struct flow_key); i++)
- printf("%02X", p[i]);
-
- printf(" @ val %d\n", val);
-}
-#else
+ printf("%s key:0x", msg);
+ for (i = 0; i < sizeof(struct flow_key); i++)
+ printf("%02X", p[i]);
-static void print_key_info(__attribute__((unused)) const char *msg,
- __attribute__((unused)) const struct flow_key *key,
- __attribute__((unused)) efd_value_t val)
-{
+ printf(" @ val %d\n", val);
+ }
}
-#endif
/* Keys used by unit test functions */
static struct flow_key keys[5] = {
--
2.17.1
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