[dpdk-dev] [EXT] RE: [PATCH 2/2] test/event_timer: improve unit test compatability
Jerin Jacob Kollanukkaran
jerinj at marvell.com
Sat Mar 30 16:05:13 CET 2019
On Mon, 2019-03-25 at 21:40 +0000, Carrillo, Erik G wrote:
> > -----Original Message-----
> > From: Pavan Nikhilesh Bhagavatula [mailto:pbhagavatula at marvell.com]
> > Sent: Saturday, March 16, 2019 3:28 PM
> > To: Jerin Jacob Kollanukkaran <jerinj at marvell.com>; Carrillo, Erik
> > G
> > <erik.g.carrillo at intel.com>
> > Cc: dev at dpdk.org; Pavan Nikhilesh Bhagavatula
> > <pbhagavatula at marvell.com>
> > Subject: [dpdk-dev] [PATCH 2/2] test/event_timer: improve unit test
> > compatability
> > From: Pavan Nikhilesh <pbhagavatula at marvell.com>
> > Check if eventdev is open system eventdevs i.e. max_num_events = -1
> > before asserting.
> > Allow event timer adapter to adjust the resolution using
> > RTE_EVENT_TIMER_ADAPTER_F_ADJUST_RES and re-calculate timeout ticks
> > based on the adjusted resolution.
> > Signed-off-by: Pavan Nikhilesh <pbhagavatula at marvell.com>
> Just one spelling nit - it should be "compatibility" in the subject
> line. With that change:
Fixed in apply.
> Acked-by: Erik Gabriel Carrillo <erik.g.carrillo at intel.com>
Series applied to dpdk-next-eventdev/master. Thanks.
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