[dpdk-dev] [PATCH v3 4/4] test: change external memory test to use system page sz
David Christensen
drc at linux.vnet.ibm.com
Wed Dec 2 00:23:39 CET 2020
> diff --git a/app/test/test_external_mem.c b/app/test/test_external_mem.c
> index 7eb81f6..67690c6 100644
> --- a/app/test/test_external_mem.c
> +++ b/app/test/test_external_mem.c
> @@ -532,8 +532,8 @@ test_extmem_basic(void *addr, size_t len, size_t pgsz, rte_iova_t *iova,
> static int
> test_external_mem(void)
> {
> + size_t pgsz = rte_mem_page_size();
I'm seeing a build warning with this code. Looks like you need:
#include <rte_eal_paging.h>
Dave
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