[dpdk-dev] [PATCH v2] test/graph: fix memory leak
kirankumark at marvell.com
kirankumark at marvell.com
Thu May 14 11:07:50 CEST 2020
From: Kiran Kumar K <kirankumark at marvell.com>
Fix memory leaks reported by coverity.
Coverity issue: 358439, 358451, 358448.
Fixes: 6b89650418("test/graph: add functional tests")
Signed-off-by: Kiran Kumar K <kirankumark at marvell.com>
---
V2 changes:
* Added Coverity issue and Fixes info.
app/test/test_graph.c | 7 +++++--
1 file changed, 5 insertions(+), 2 deletions(-)
diff --git a/app/test/test_graph.c b/app/test/test_graph.c
index cf6df0744..ed69eda99 100644
--- a/app/test/test_graph.c
+++ b/app/test/test_graph.c
@@ -12,6 +12,7 @@
#include <rte_graph.h>
#include <rte_graph_worker.h>
#include <rte_mbuf.h>
+#include <rte_random.h>
#include "test.h"
@@ -145,7 +146,7 @@ uint16_t
test_node_worker_source(struct rte_graph *graph, struct rte_node *node,
void **objs, uint16_t nb_objs)
{
- uint32_t obj_node0 = rand() % 100, obj_node1;
+ uint32_t obj_node0 = rte_rand() % 100, obj_node1;
test_main_t *tm = &test_main;
struct rte_mbuf *data;
void **next_stream;
@@ -193,7 +194,7 @@ test_node0_worker(struct rte_graph *graph, struct rte_node *node, void **objs,
test_main_t *tm = &test_main;
if (*(uint32_t *)node->ctx == test_node0.id) {
- uint32_t obj_node0 = rand() % 100, obj_node1;
+ uint32_t obj_node0 = rte_rand() % 100, obj_node1;
struct rte_mbuf *data;
uint8_t second_pass = 0;
uint32_t count = 0;
@@ -496,6 +497,7 @@ test_lookup_functions(void)
printf("Test number of edges for node = %s failed Expected = %d, got %d\n",
tm->test_node[i].node.name,
tm->test_node[i].node.nb_edges, count);
+ free(next_edges);
return -1;
}
@@ -505,6 +507,7 @@ test_lookup_functions(void)
printf("Edge name miss match, expected = %s got = %s\n",
tm->test_node[i].node.next_nodes[j],
next_edges[j]);
+ free(next_edges);
return -1;
}
}
--
2.17.1
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