[dpdk-test-report] |WARNING| pw100651 [PATCH] [v9] bbdev: add device info related to data endianness assumption
dpdklab at iol.unh.edu
dpdklab at iol.unh.edu
Wed Oct 6 23:29:00 CEST 2021
Test-Label: iol-testing
Test-Status: WARNING
http://dpdk.org/patch/100651
_apply patch failure_
Submitter: Chautru, Nicolas <nicolas.chautru at intel.com>
Date: Wednesday, October 06 2021 20:58:49
Applied on: CommitID:2700326085033fd13339a8de31f58a95d1ee9c3f
Apply patch set 100651 failed:
Checking patch doc/guides/rel_notes/release_21_11.rst...
error: while searching for:
* bbdev: Added capability related to more comprehensive CRC options.
ABI Changes
-----------
error: patch failed: doc/guides/rel_notes/release_21_11.rst:191
Checking patch drivers/baseband/acc100/rte_acc100_pmd.c...
Hunk #1 succeeded at 1088 (offset -1 lines).
Checking patch drivers/baseband/fpga_5gnr_fec/rte_fpga_5gnr_fec.c...
Checking patch drivers/baseband/fpga_lte_fec/fpga_lte_fec.c...
Checking patch drivers/baseband/turbo_sw/bbdev_turbo_software.c...
Hunk #1 succeeded at 251 (offset -2 lines).
Checking patch lib/bbdev/rte_bbdev.h...
Applying patch doc/guides/rel_notes/release_21_11.rst with 1 reject...
Rejected hunk #1.
Applied patch drivers/baseband/acc100/rte_acc100_pmd.c cleanly.
Applied patch drivers/baseband/fpga_5gnr_fec/rte_fpga_5gnr_fec.c cleanly.
Applied patch drivers/baseband/fpga_lte_fec/fpga_lte_fec.c cleanly.
Applied patch drivers/baseband/turbo_sw/bbdev_turbo_software.c cleanly.
Applied patch lib/bbdev/rte_bbdev.h cleanly.
diff a/doc/guides/rel_notes/release_21_11.rst b/doc/guides/rel_notes/release_21_11.rst (rejected hunks)
@@ -191,6 +191,7 @@ API Changes
* bbdev: Added capability related to more comprehensive CRC options.
+* bbdev: Added device info related to data byte endianness processing assumption.
ABI Changes
-----------
https://lab.dpdk.org/results/dashboard/patchsets/19206/
UNH-IOL DPDK Community Lab
More information about the test-report
mailing list