[dpdk-test-report] |SUCCESS| pw100960 [PATCH v10 1/8] bbdev: add device info related to data endianness

checkpatch at dpdk.org checkpatch at dpdk.org
Mon Oct 11 06:33:37 CEST 2021

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Test-Label: checkpatch
Test-Status: SUCCESS
http://dpdk.org/patch/100960

_coding style OK_

Previous message (by thread): [dpdk-test-report] |SUCCESS| pw(100842) sid(19467) job(PER_PATCH_BUILD8565)[v2, 3/3] security: add reserved bitfields
Next message (by thread): [dpdk-test-report] |SUCCESS| pw100961 [PATCH v10 2/8] baseband: introduce NXP LA12xx driver
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