|SUCCESS| pw129210 [PATCH] [v5] bitmap: add scan from offset functio

[dpdklab at iol.unh.edu]

Test-Label: iol-abi-testing
Test-Status: SUCCESS
http://dpdk.org/patch/129210

_Testing PASS_

Submitter: Volodymyr Fialko <vfialko at marvell.com>
Date: Monday, July 03 2023 12:39:08 
DPDK git baseline: Repo:dpdk
  Branch: master
  CommitID:93a4b3beba4ee611685148917981f846427cafb2

129210 --> testing pass

Test environment and result as below:

+------------------+----------+
|   Environment    | abi_test |
+==================+==========+
| openSUSE Leap 15 | PASS     |
+------------------+----------+


openSUSE Leap 15
	Kernel: 4.18.0-240.10.1.el8_3.x86_64
	Compiler: gcc 7.5.0

To view detailed results, visit:
https://lab.dpdk.org/results/dashboard/patchsets/26934/

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