[dpdk-dev] [PATCH] app/test: add tests with corrupted data for QAT test suite

[Jain, Deepak K]

> -----Original Message-----
> From: Kusztal, ArkadiuszX
> Sent: Thursday, October 13, 2016 11:04 AM
> To: dev at dpdk.org
> Cc: Trahe, Fiona <fiona.trahe at intel.com>; Jain, Deepak K
> <deepak.k.jain at intel.com>; De Lara Guarch, Pablo
> <pablo.de.lara.guarch at intel.com>; Griffin, John <john.griffin at intel.com>;
> Kusztal, ArkadiuszX <arkadiuszx.kusztal at intel.com>
> Subject: [PATCH] app/test: add tests with corrupted data for QAT test suite
> 
> This commit adds tests with corrupted data to the Intel QuickAssist
> Technology tests suite in test_cryptodev.c
> 
> Signed-off-by: Arek Kusztal <arkadiuszx.kusztal at intel.com>
> ---
>  app/test/test_cryptodev.c | 14 ++++++++++++++
>  1 file changed, 14 insertions(+)
> 
>  };
> --
> 2.1.0
Acked-by: Deepak Kumar Jain <deepak.k.jain at intel.com>