[dpdk-dev] [PATCH 1/7] event/octeontx: move eventdev octeontx test to driver
Van Haaren, Harry
harry.van.haaren at intel.com
Wed Dec 13 11:19:51 CET 2017
> -----Original Message-----
> From: Pavan Nikhilesh [mailto:pbhagavatula at caviumnetworks.com]
> Sent: Tuesday, December 12, 2017 7:27 PM
> To: jerin.jacob at caviumnetworks.com; Richardson, Bruce
> <bruce.richardson at intel.com>; Van Haaren, Harry
> <harry.van.haaren at intel.com>; Eads, Gage <gage.eads at intel.com>;
> hemant.agrawal at nxp.com; nipun.gupta at nxp.com; Ma, Liang J
> <liang.j.ma at intel.com>
> Cc: dev at dpdk.org; Pavan Nikhilesh <pbhagavatula at caviumnetworks.com>
> Subject: [dpdk-dev] [PATCH 1/7] event/octeontx: move eventdev octeontx test
> to driver
> Move octeontx eventdev specific test (test_eventdev_octeontx.c) to
<snip patch content>
Replying to 1st patch, as no cover letter;
Summary of patchset:
- Move tests for a specific Eventdev PMD into the PMD dir: drivers/event/x/x_selftest.c
- Enable self tests to run when passed the vdev arg "self-test=1"
A few comments on this change;
1) We should not lose the capability to run tests as part of the existing unit testing infrastructure. We should not fragment the testing tool - requiring multiple binaries to test a single component.
>From discussion on #IRC, it seems reasonable to call rte_eal_vdev_init() with "self-test=1" from the test/test/ code, and then we can continue to use the existing test infrastructure despite that the actual tests are now part of each PMD.
2) We should not copy/paste TEST_ASSERT macros into new test files. Abstracting the TEST_ASSERT and other macros out to a header file would solve this duplication.
Specific comments will be sent as replies to the patches. Cheers, -Harry
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