[dpdk-dev] [PATCH 06/33] app/testeventdev: define the test options

Van Haaren, Harry harry.van.haaren at intel.com
Fri Jun 23 15:07:10 CEST 2017


> From: Jerin Jacob [mailto:jerin.jacob at caviumnetworks.com]
> Sent: Sunday, May 28, 2017 8:58 PM
> To: dev at dpdk.org
> Cc: Richardson, Bruce <bruce.richardson at intel.com>; Van Haaren, Harry
> <harry.van.haaren at intel.com>; hemant.agrawal at nxp.com; Eads, Gage <gage.eads at intel.com>;
> nipun.gupta at nxp.com; Vangati, Narender <narender.vangati at intel.com>; Rao, Nikhil
> <nikhil.rao at intel.com>; gprathyusha at caviumnetworks.com; Jerin Jacob
> <jerin.jacob at caviumnetworks.com>
> Subject: [dpdk-dev] [PATCH 06/33] app/testeventdev: define the test options
> 
> Define the test options that used across all test cases and
> fill the default values for the same.
> 
> Signed-off-by: Jerin Jacob <jerin.jacob at caviumnetworks.com>
> Signed-off-by: Guduri Prathyusha <gprathyusha at caviumnetworks.com>

<snip>


> +void
> +evt_options_default(struct evt_options *opt)
> +{
> +	memset(opt, 0, sizeof(*opt));
> +	opt->verbose_level = 1; /* Enable minimal prints */
> +	opt->dev_id = 0;
> +	strncpy(opt->test_name, "queue_order", EVT_TEST_NAME_MAX_LEN);

I think "queue_order" isn't a valid test name, we should probably make the default test to run something that is supported by all PMDs, performance testing of atomic traffic?

With that resolved,

Acked-by: Harry van Haaren <harry.van.haaren at intel.com>


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