[dpdk-dev] [PATCH] test: reduce test duration for efd autotest

Pattan, Reshma reshma.pattan at intel.com
Wed Oct 17 15:33:24 CEST 2018



> -----Original Message-----
> From: Parthasarathy, JananeeX M
> Sent: Wednesday, September 26, 2018 3:19 PM
> To: dev at dpdk.org
> 
>  	struct rte_efd_table *handle = NULL;
>  	uint32_t num_rules_in = TABLE_SIZE;
> -	uint8_t simple_key[EFD_TEST_KEY_LEN];

You need to remove EFD_TEST_KEY_LEN macro from the code now, as it is not is not used now.

Also seems like they want to use the key of length 8 bytes as per this test.
But after your changes we are going to have one byte key , so is the test behaving same before and after this key change?
 

> +		val = mrand48() & VALUE_BITMASK;

Can we use rte_rand() here instead of mrand48()? 
What was the reason for using mrand8()?

Thanks,
Reshma


More information about the dev mailing list