[dpdk-dev] [PATCH v4 2/6] test/hash: change multiwriter test to use jhash

Yipeng Wang yipeng1.wang at intel.com
Fri Oct 26 11:53:42 CEST 2018


With sequential key, the test will cover more corner
cases with jhash instead of crc hash, since jhash
generates more random hash pattern on sequential key.
It is useful for functional verification.

Signed-off-by: Yipeng Wang <yipeng1.wang at intel.com>
---
 test/test/test_hash_multiwriter.c | 3 ++-
 1 file changed, 2 insertions(+), 1 deletion(-)

diff --git a/test/test/test_hash_multiwriter.c b/test/test/test_hash_multiwriter.c
index 6a3eb10..d447f6d 100644
--- a/test/test/test_hash_multiwriter.c
+++ b/test/test/test_hash_multiwriter.c
@@ -12,6 +12,7 @@
 #include <rte_malloc.h>
 #include <rte_random.h>
 #include <rte_spinlock.h>
+#include <rte_jhash.h>
 
 #include "test.h"
 
@@ -108,7 +109,7 @@ test_hash_multiwriter(void)
 	struct rte_hash_parameters hash_params = {
 		.entries = nb_entries,
 		.key_len = sizeof(uint32_t),
-		.hash_func = rte_hash_crc,
+		.hash_func = rte_jhash,
 		.hash_func_init_val = 0,
 		.socket_id = rte_socket_id(),
 	};
-- 
2.7.4



More information about the dev mailing list