[dpdk-dev] [PATCH v2] test: reduce test duration for efd autotest

[Pattan, Reshma]

Hi,

-----Original Message-----
From: Parthasarathy, JananeeX M 
Sent: Wednesday, October 31, 2018 2:30 PM
To: dev at dpdk.org
Cc: Marohn, Byron <byron.marohn at intel.com>; De Lara Guarch, Pablo <pablo.de.lara.guarch at intel.com>; Pattan, Reshma <reshma.pattan at intel.com>; Parthasarathy, JananeeX M <jananeex.m.parthasarathy at intel.com>
Subject: [PATCH v2] test: reduce test duration for efd autotest

Reduced test time for efd_autotest.
Key length is updated, invoke times of random function is reduced.

Commit message should be changed a bit to reflect v2 changes.

 	for (j = 0; j < ITERATIONS; j++) {
 		handle = rte_efd_create("test_efd", num_rules_in,
-				EFD_TEST_KEY_LEN, efd_get_all_sockets_bitmask(),
+				sizeof(uint8_t), efd_get_all_sockets_bitmask(),

sizeof(uint8_t) ==> sizeof(simple_key). Now simple key is of type uint64_t. 

Other than that. Please keep my ack in next version.

Acked-by: Reshma Pattan <reshma.pattan at intel.com>