[dpdk-dev] [PATCH v2] test: reduce test duration for efd autotest
Pattan, Reshma
reshma.pattan at intel.com
Wed Oct 31 17:11:49 CET 2018
Hi,
-----Original Message-----
From: Parthasarathy, JananeeX M
Sent: Wednesday, October 31, 2018 2:30 PM
To: dev at dpdk.org
Cc: Marohn, Byron <byron.marohn at intel.com>; De Lara Guarch, Pablo <pablo.de.lara.guarch at intel.com>; Pattan, Reshma <reshma.pattan at intel.com>; Parthasarathy, JananeeX M <jananeex.m.parthasarathy at intel.com>
Subject: [PATCH v2] test: reduce test duration for efd autotest
Reduced test time for efd_autotest.
Key length is updated, invoke times of random function is reduced.
Commit message should be changed a bit to reflect v2 changes.
for (j = 0; j < ITERATIONS; j++) {
handle = rte_efd_create("test_efd", num_rules_in,
- EFD_TEST_KEY_LEN, efd_get_all_sockets_bitmask(),
+ sizeof(uint8_t), efd_get_all_sockets_bitmask(),
sizeof(uint8_t) ==> sizeof(simple_key). Now simple key is of type uint64_t.
Other than that. Please keep my ack in next version.
Acked-by: Reshma Pattan <reshma.pattan at intel.com>
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