[dpdk-dev] [PATCH] test: reduce test duration for efd autotest

[Jananee Parthasarathy]

Reduced test time for efd_autotest.
Key length is updated, invoke times of random function is reduced.

Signed-off-by: Jananee Parthasarathy <jananeex.m.parthasarathy at intel.com>
---
 test/test/test_efd.c | 17 ++++++++---------
 1 file changed, 8 insertions(+), 9 deletions(-)

diff --git a/test/test/test_efd.c b/test/test/test_efd.c
index ced091aab..893a09c03 100644
--- a/test/test/test_efd.c
+++ b/test/test/test_efd.c
@@ -331,8 +331,9 @@ static int test_average_table_utilization(void)
 {
 	struct rte_efd_table *handle = NULL;
 	uint32_t num_rules_in = TABLE_SIZE;
-	uint8_t simple_key[EFD_TEST_KEY_LEN];
-	unsigned int i, j;
+	uint8_t simple_key;
+	unsigned int j;
+	efd_value_t val;
 	unsigned int added_keys, average_keys_added = 0;
 
 	printf("Evaluating table utilization and correctness, please wait\n");
@@ -340,7 +341,7 @@ static int test_average_table_utilization(void)
 
 	for (j = 0; j < ITERATIONS; j++) {
 		handle = rte_efd_create("test_efd", num_rules_in,
-				EFD_TEST_KEY_LEN, efd_get_all_sockets_bitmask(),
+				sizeof(uint8_t), efd_get_all_sockets_bitmask(),
 				test_socket_id);
 		if (handle == NULL) {
 			printf("efd table creation failed\n");
@@ -350,18 +351,16 @@ static int test_average_table_utilization(void)
 		unsigned int succeeded = 0;
 		unsigned int lost_keys = 0;
 
+		val = mrand48() & VALUE_BITMASK;
 		/* Add random entries until key cannot be added */
 		for (added_keys = 0; added_keys < num_rules_in; added_keys++) {
 
-			for (i = 0; i < EFD_TEST_KEY_LEN; i++)
-				simple_key[i] = rte_rand() & 0xFF;
+			simple_key = rte_rand() & 0xFF;
 
-			efd_value_t val = simple_key[0];
-
-			if (rte_efd_update(handle, test_socket_id, simple_key,
+			if (rte_efd_update(handle, test_socket_id, &simple_key,
 						val))
 				break; /* continue;*/
-			if (rte_efd_lookup(handle, test_socket_id, simple_key)
+			if (rte_efd_lookup(handle, test_socket_id, &simple_key)
 					!= val)
 				lost_keys++;
 			else
-- 
2.13.6