[dpdk-dev] [PATCH v3] test: reduce test duration for efd autotest

[Parthasarathy, JananeeX M]

Hi,

>-----Original Message-----
>From: Thomas Monjalon [mailto:thomas at monjalon.net]
>Sent: Friday, July 05, 2019 3:17 AM
>To: dev at dpdk.org
>Cc: Parthasarathy, JananeeX M <jananeex.m.parthasarathy at intel.com>;
>Marohn, Byron <byron.marohn at intel.com>; De Lara Guarch, Pablo
><pablo.de.lara.guarch at intel.com>; Pattan, Reshma
><reshma.pattan at intel.com>; david.marchand at redhat.com;
>aconole at redhat.com
>Subject: Re: [dpdk-dev] [PATCH v3] test: reduce test duration for efd autotest
>
>Still no review for this patch?
>
>20/01/2019 22:25, Thomas Monjalon:
>> Any review please?
>>
>> 29/11/2018 08:36, Jananee Parthasarathy:
>> > Reduced test time for efd_autotest.
>> > Key length is updated, invoke times of random function is reduced.
>> > Different value is updated for each hash key entry.
>> >
>> > Signed-off-by: Jananee Parthasarathy
><jananeex.m.parthasarathy at intel.com>
>
>
>
Self NACK.
Although this patch reduces test duration it reduces the number of combinations which is not useful.
Hence as per discussion with Maintainer, this patch can be ignored.

Regards
M.P.Jananee