[dpdk-dev] [PATCH v8 0/3] generic spinlock optimization and test case enhancements

Nipun Gupta nipun.gupta at nxp.com
Mon Mar 11 13:21:23 CET 2019


> -----Original Message-----
> From: Gavin Hu [mailto:gavin.hu at arm.com]
> Sent: Friday, March 8, 2019 1:27 PM
> To: dev at dpdk.org
> Cc: nd at arm.com; thomas at monjalon.net; jerinj at marvell.com; Hemant
> Agrawal <hemant.agrawal at nxp.com>; Nipun Gupta
> <nipun.gupta at nxp.com>; Honnappa.Nagarahalli at arm.com;
> gavin.hu at arm.com; i.maximets at samsung.com;
> chaozhu at linux.vnet.ibm.com
> Subject: [PATCH v8 0/3] generic spinlock optimization and test case
> enhancements
> 
...

> 
> Gavin Hu (3):
>   test/spinlock: remove 1us delay for correct benchmarking
>   test/spinlock: amortize the cost of getting time
>   spinlock: reimplement with atomic one-way barrier builtins
> 
>  app/test/test_spinlock.c                           | 31 +++++++++++-----------
>  .../common/include/generic/rte_spinlock.h          | 18 +++++++++----
>  2 files changed, 29 insertions(+), 20 deletions(-)
> 
> --

Seems good.

Series-Acked-by: Nipun Gupta <nipun.gupta at nxp.com>



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