[dpdk-dev] [PATCH 2/2] test/crypto: add negative test support for dpaaX

[Hemant Agrawal]

Signed-off-by: Hemant Agrawal <hemant.agrawal at nxp.com>
---
 app/test/test_cryptodev.c | 20 ++++++++++++++++++++
 1 file changed, 20 insertions(+)

diff --git a/app/test/test_cryptodev.c b/app/test/test_cryptodev.c
index 915acf13c..eb2cfdde6 100644
--- a/app/test/test_cryptodev.c
+++ b/app/test/test_cryptodev.c
@@ -11513,6 +11513,16 @@ static struct unit_test_suite cryptodev_dpaa_sec_testsuite  = {
 		TEST_CASE_ST(ut_setup, ut_teardown,
 			test_AES_GCM_auth_encrypt_SGL_out_of_place_1500B_2000B),
 
+		/** Negative tests */
+		TEST_CASE_ST(ut_setup, ut_teardown,
+			authentication_verify_HMAC_SHA1_fail_data_corrupt),
+		TEST_CASE_ST(ut_setup, ut_teardown,
+			authentication_verify_HMAC_SHA1_fail_tag_corrupt),
+		TEST_CASE_ST(ut_setup, ut_teardown,
+			auth_decryption_AES128CBC_HMAC_SHA1_fail_data_corrupt),
+		TEST_CASE_ST(ut_setup, ut_teardown,
+			auth_decryption_AES128CBC_HMAC_SHA1_fail_tag_corrupt),
+
 		TEST_CASES_END() /**< NULL terminate unit test array */
 	}
 };
@@ -11650,6 +11660,16 @@ static struct unit_test_suite cryptodev_dpaa2_sec_testsuite  = {
 		TEST_CASE_ST(ut_setup, ut_teardown,
 			test_AES_GCM_auth_encrypt_SGL_out_of_place_1500B_2000B),
 
+		/** Negative tests */
+		TEST_CASE_ST(ut_setup, ut_teardown,
+			authentication_verify_HMAC_SHA1_fail_data_corrupt),
+		TEST_CASE_ST(ut_setup, ut_teardown,
+			authentication_verify_HMAC_SHA1_fail_tag_corrupt),
+		TEST_CASE_ST(ut_setup, ut_teardown,
+			auth_decryption_AES128CBC_HMAC_SHA1_fail_data_corrupt),
+		TEST_CASE_ST(ut_setup, ut_teardown,
+			auth_decryption_AES128CBC_HMAC_SHA1_fail_tag_corrupt),
+
 		TEST_CASES_END() /**< NULL terminate unit test array */
 	}
 };
-- 
2.17.1