[dpdk-dev] [PATCH v2 1/1] test/meson: hash lf test moved to dpdk perf testsuite

agupta3 at marvell.com agupta3 at marvell.com
Fri Sep 13 10:15:54 CEST 2019


From: Amit Gupta <agupta3 at marvell.com>

hash_readwrite_lf test always getting TIMEOUT as required
time to finish this test was much longer compare to time
required for fast tests(10s). Hence, the test is being renamed
moved to perf test category for its execution to complete.

Signed-off-by: Amit Gupta <agupta3 at marvell.com>
---
v2 Changes:
*hash_readwrite_lf_autotest renamed to hash_readwrite_lf_pref_autotest

 app/test/meson.build              | 2 +-
 app/test/test_hash_readwrite_lf.c | 3 ++-
 2 files changed, 3 insertions(+), 2 deletions(-)

diff --git a/app/test/meson.build b/app/test/meson.build
index 94fd9f8..57d5316 100644
--- a/app/test/meson.build
+++ b/app/test/meson.build
@@ -220,7 +220,6 @@ fast_test_names = [
         'eventdev_common_autotest',
         'fbarray_autotest',
         'hash_readwrite_func_autotest',
-        'hash_readwrite_lf_autotest',
         'ipsec_autotest',
         'kni_autotest',
         'kvargs_autotest',
@@ -263,6 +262,7 @@ perf_test_names = [
         'stack_lf_perf_autotest',
         'rand_perf_autotest',
         'hash_readwrite_perf_autotest',
+        'hash_readwrite_lf_perf_autotest',
 ]
 
 driver_test_names = [
diff --git a/app/test/test_hash_readwrite_lf.c b/app/test/test_hash_readwrite_lf.c
index 1f2fba4..33d63fa 100644
--- a/app/test/test_hash_readwrite_lf.c
+++ b/app/test/test_hash_readwrite_lf.c
@@ -1431,4 +1431,5 @@ struct {
 	return 0;
 }
 
-REGISTER_TEST_COMMAND(hash_readwrite_lf_autotest, test_hash_readwrite_lf_main);
+REGISTER_TEST_COMMAND(hash_readwrite_lf_perf_autotest,
+		      test_hash_readwrite_lf_main);
-- 
1.8.3.1



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