[dpdk-dev] [PATCH v2 1/1] test/crypto: remove repeated test and enable on QAT
Adam Dybkowski
adamx.dybkowski at intel.com
Wed Jan 22 15:42:07 CET 2020
Remove one AES GCM scatter-gather unit test repetition
and enable this test on QAT (after a fix included in the commit
b26ef1a11f21).
Fixes: 157d0b11d204 ("test/crypto: add capability checks")
Fixes: b26ef1a11f21 ("test/crypto: fix missing operation status check")
Signed-off-by: Adam Dybkowski <adamx.dybkowski at intel.com>
---
app/test/test_cryptodev.c | 7 -------
1 file changed, 7 deletions(-)
diff --git a/app/test/test_cryptodev.c b/app/test/test_cryptodev.c
index 749c3c1b2..12c113848 100644
--- a/app/test/test_cryptodev.c
+++ b/app/test/test_cryptodev.c
@@ -11158,11 +11158,6 @@ test_AES_GCM_auth_encrypt_SGL_out_of_place_1500B_2000B(void)
static int
test_AES_GCM_auth_encrypt_SGL_out_of_place_400B_1seg(void)
{
- /* This test is not for QAT PMD */
- if (gbl_driver_id == rte_cryptodev_driver_id_get(
- RTE_STR(CRYPTODEV_NAME_QAT_SYM_PMD)))
- return -ENOTSUP;
-
return test_authenticated_encryption_SGL(
&gcm_test_case_8, OUT_OF_PLACE, 400,
gcm_test_case_8.plaintext.len);
@@ -11617,8 +11612,6 @@ static struct unit_test_suite cryptodev_testsuite = {
/** AES GCM Authenticated Encryption */
TEST_CASE_ST(ut_setup, ut_teardown,
test_AES_GCM_auth_encrypt_SGL_in_place_1500B),
- TEST_CASE_ST(ut_setup, ut_teardown,
- test_AES_GCM_auth_encrypt_SGL_out_of_place_400B_1seg),
TEST_CASE_ST(ut_setup, ut_teardown,
test_AES_GCM_auth_encrypt_SGL_out_of_place_400B_400B),
TEST_CASE_ST(ut_setup, ut_teardown,
--
2.17.1
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