[dpdk-dev] [PATCH v3 6/7] app/bbdev: reduce duration of throughput test
Liu, Tianjiao
tianjiao.liu at intel.com
Thu Oct 15 07:20:39 CEST 2020
Acked-by: Liu Tianjiao <tianjiao.liu at intel.com>
> -----Original Message-----
> From: Chautru, Nicolas <nicolas.chautru at intel.com>
> Sent: Tuesday, August 18, 2020 5:06 PM
> To: dev at dpdk.org; akhil.goyal at nxp.com
> Cc: Richardson, Bruce <bruce.richardson at intel.com>; Chautru, Nicolas
> <nicolas.chautru at intel.com>
> Subject: [PATCH v3 6/7] app/bbdev: reduce duration of throughput test
>
> Reducing number of repetitions from 1000 to 100 to save time. Results
> are accurate enough with
> 100 loops.
>
> Signed-off-by: Nicolas Chautru <nicolas.chautru at intel.com>
> ---
> app/test-bbdev/test_bbdev_perf.c | 2 +-
> 1 file changed, 1 insertion(+), 1 deletion(-)
>
> diff --git a/app/test-bbdev/test_bbdev_perf.c b/app/test-
> bbdev/test_bbdev_perf.c index a6cd94b..c5156a2 100644
> --- a/app/test-bbdev/test_bbdev_perf.c
> +++ b/app/test-bbdev/test_bbdev_perf.c
> @@ -24,7 +24,7 @@
> #define GET_SOCKET(socket_id) (((socket_id) == SOCKET_ID_ANY) ? 0 :
> (socket_id))
>
> #define MAX_QUEUES RTE_MAX_LCORE
> -#define TEST_REPETITIONS 1000
> +#define TEST_REPETITIONS 100
> #define WAIT_OFFLOAD_US 1000
>
> #ifdef RTE_LIBRTE_PMD_BBDEV_FPGA_LTE_FEC
> --
> 1.8.3.1
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