[dpdk-dev] [PATCH v6 06/15] event/sw: switch test counter to dynamic mbuf field

Van Haaren, Harry harry.van.haaren at intel.com
Fri Oct 30 19:53:50 CET 2020


> -----Original Message-----
> From: Thomas Monjalon <thomas at monjalon.net>
> Sent: Friday, October 30, 2020 5:45 PM
> To: dev at dpdk.org
> Cc: Yigit, Ferruh <ferruh.yigit at intel.com>; david.marchand at redhat.com;
> Richardson, Bruce <bruce.richardson at intel.com>; olivier.matz at 6wind.com;
> andrew.rybchenko at oktetlabs.ru; akhil.goyal at nxp.com; jerinj at marvell.com; Van
> Haaren, Harry <harry.van.haaren at intel.com>
> Subject: [PATCH v6 06/15] event/sw: switch test counter to dynamic mbuf field
> 
> The test worker_loopback used the deprecated mbuf field udata64.
> It is moved to a dynamic field in order to allow removal of udata64.
> 
> Signed-off-by: Thomas Monjalon <thomas at monjalon.net>
> Reviewed-by: Andrew Rybchenko <andrew.rybchenko at oktetlabs.ru>

Review fine, tests fine, thanks!

Acked-by: Harry van Haaren <harry.van.haaren at intel.com>


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