[dpdk-dev] [PATCH v4] guides: add a guide for developing unit tests

Mcnamara, John john.mcnamara at intel.com
Fri Aug 6 11:53:07 CEST 2021



> +  $ ./build/app/test/dpdk-test --dpdk-options-here
> +  EAL: Detected 4 lcore(s)
> +  EAL: Detected 1 NUMA nodes
> +  EAL: Static memory layout is selected, amount of reserved memory can be adjusted with -m or --socket-mem
> +  EAL: Multi-process socket /run/user/26934/dpdk/rte/mp_socket
> +  EAL: Selected IOVA mode 'VA'
> +  EAL: Probing VFIO support...
> +  EAL: PCI device 0000:00:1f.6 on NUMA socket -1
> +  EAL:   Invalid NUMA socket, default to 0
> +  EAL:   probe driver: 8086:15d7 net_e1000_em
> +  APP: HPET is not enabled, using TSC as default timer  RTE>>


Minor suggestion. You could truncate the long "Static memory" line in this and other blocks to prevent it invoking the scroll bars. Something, like this:

> +  EAL: Static memory layout is selected ...


Apart from that, great work on trawling through the weeds of the DPDK units test infrastructure and creating this really useful doc.

Thank you.

Acked-by: John McNamara <john.mcnamara at intel.com>


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