[dpdk-dev] [PATCH v2] doc/guides: add details for new test structure

Zhang, Roy Fan roy.fan.zhang at intel.com
Mon Jul 19 13:06:47 CEST 2021


> -----Original Message-----
> From: Power, Ciara <ciara.power at intel.com>
> Sent: Friday, July 16, 2021 2:40 PM
> To: dev at dpdk.org
> Cc: Zhang, Roy Fan <roy.fan.zhang at intel.com>; Doherty, Declan
> <declan.doherty at intel.com>; aconole at redhat.com; Power, Ciara
> <ciara.power at intel.com>
> Subject: [PATCH v2] doc/guides: add details for new test structure
> 
> The testing guide is now updated to include details about
> using sub-testsuites. Some example code is given to demonstrate how
> they can be used.
> 
> A note is also added to highlight the need for using vdev EAL args when
> running cryptodev tests.
> 
> Depends-on: patch-95866 ("guides: add a guide for developing unit tests")
> 
> Signed-off-by: Ciara Power <ciara.power at intel.com>
> 

Acked-by: Fan Zhang <roy.fan.zhang at intel.com>


More information about the dev mailing list