[dpdk-dev] [PATCH v2] doc/guides: add details for new test structure
Zhang, Roy Fan
roy.fan.zhang at intel.com
Mon Jul 19 13:06:47 CEST 2021
> -----Original Message-----
> From: Power, Ciara <ciara.power at intel.com>
> Sent: Friday, July 16, 2021 2:40 PM
> To: dev at dpdk.org
> Cc: Zhang, Roy Fan <roy.fan.zhang at intel.com>; Doherty, Declan
> <declan.doherty at intel.com>; aconole at redhat.com; Power, Ciara
> <ciara.power at intel.com>
> Subject: [PATCH v2] doc/guides: add details for new test structure
>
> The testing guide is now updated to include details about
> using sub-testsuites. Some example code is given to demonstrate how
> they can be used.
>
> A note is also added to highlight the need for using vdev EAL args when
> running cryptodev tests.
>
> Depends-on: patch-95866 ("guides: add a guide for developing unit tests")
>
> Signed-off-by: Ciara Power <ciara.power at intel.com>
>
Acked-by: Fan Zhang <roy.fan.zhang at intel.com>
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