[dpdk-dev] [PATCH] test/event: fix timeout accuracy

[pbhagavatula at marvell.com]

From: Pavan Nikhilesh <pbhagavatula at marvell.com>

Round timeout ticks when converting from nanoseconds, this prevents
loss of accuracy and deviation from requested timeout value.

Fixes: d1f3385d0076 ("test: add event timer adapter auto-test")
Cc: stable at dpdk.org

Signed-off-by: Pavan Nikhilesh <pbhagavatula at marvell.com>
---
 app/test/test_event_timer_adapter.c | 4 +++-
 1 file changed, 3 insertions(+), 1 deletion(-)

diff --git a/app/test/test_event_timer_adapter.c b/app/test/test_event_timer_adapter.c
index ad3f4dcc2..b536ddef4 100644
--- a/app/test/test_event_timer_adapter.c
+++ b/app/test/test_event_timer_adapter.c
@@ -3,6 +3,8 @@
  * Copyright(c) 2017-2018 Intel Corporation.
  */
 
+#include <math.h>
+
 #include <rte_atomic.h>
 #include <rte_common.h>
 #include <rte_cycles.h>
@@ -46,7 +48,7 @@ static uint64_t global_info_bkt_tck_ns;
 static volatile uint8_t arm_done;
 
 #define CALC_TICKS(tks)					\
-	((tks * global_bkt_tck_ns) / global_info_bkt_tck_ns)
+	ceil((double)(tks * global_bkt_tck_ns) / global_info_bkt_tck_ns)
 
 
 static bool using_services;
-- 
2.17.1