[dpdk-dev] [PATCH] test/event: fix timeout accuracy
pbhagavatula at marvell.com
pbhagavatula at marvell.com
Sat Mar 6 21:26:58 CET 2021
From: Pavan Nikhilesh <pbhagavatula at marvell.com>
Round timeout ticks when converting from nanoseconds, this prevents
loss of accuracy and deviation from requested timeout value.
Fixes: d1f3385d0076 ("test: add event timer adapter auto-test")
Cc: stable at dpdk.org
Signed-off-by: Pavan Nikhilesh <pbhagavatula at marvell.com>
---
app/test/test_event_timer_adapter.c | 4 +++-
1 file changed, 3 insertions(+), 1 deletion(-)
diff --git a/app/test/test_event_timer_adapter.c b/app/test/test_event_timer_adapter.c
index ad3f4dcc2..b536ddef4 100644
--- a/app/test/test_event_timer_adapter.c
+++ b/app/test/test_event_timer_adapter.c
@@ -3,6 +3,8 @@
* Copyright(c) 2017-2018 Intel Corporation.
*/
+#include <math.h>
+
#include <rte_atomic.h>
#include <rte_common.h>
#include <rte_cycles.h>
@@ -46,7 +48,7 @@ static uint64_t global_info_bkt_tck_ns;
static volatile uint8_t arm_done;
#define CALC_TICKS(tks) \
- ((tks * global_bkt_tck_ns) / global_info_bkt_tck_ns)
+ ceil((double)(tks * global_bkt_tck_ns) / global_info_bkt_tck_ns)
static bool using_services;
--
2.17.1
More information about the dev
mailing list