[Bug 1240] [dpdk-23.07] meson_test/test_fasts: test eal_flags_file_prefix_autotest failed with `-a xx:xx.x ` parameter
bugzilla at dpdk.org
bugzilla at dpdk.org
Mon May 29 11:50:23 CEST 2023
https://bugs.dpdk.org/show_bug.cgi?id=1240
Bug ID: 1240
Summary: [dpdk-23.07] meson_test/test_fasts: test
eal_flags_file_prefix_autotest failed with `-a xx:xx.x
` parameter
Product: DPDK
Version: 23.07
Hardware: x86
OS: All
Status: UNCONFIRMED
Severity: normal
Priority: Normal
Component: meson
Assignee: dev at dpdk.org
Reporter: dukaix.yuan at intel.com
Target Milestone: ---
Environment
DPDK version: dpdk 23.07 c9df59bcc9be
Other software versions: N/A
OS: Ubuntu22.04.2/5.15.45-051545-generic
Compiler: gcc (Ubuntu 11.3.0-1ubuntu1~22.04) 11.3.0
Hardware platform: Intel(R) Xeon(R) Platinum 8380 CPU @ 2.30GHz
NIC hardware: N/A.
NIC firmware: N/A
[Test Setup]
1.Use the following command to bind NIC port to DPDK:
dpdk-devbind.py -b vfio-pci 31:00.0 31:00.1 b1:00.0 b1:00.1
2. Use the following command to build DPDK:
rm -rf x86_64-native-linuxapp-gcc
CC=gcc meson --werror -Denable_kmods=True -Dlibdir=lib -Dexamples=all
--default-library=static x86_64-native-linuxapp-gcc
ninja -C x86_64-native-linuxapp-gcc -j 110
3. Execute the following command in the dpdk directory,the test result will be
FAILED:
DPDK_TEST=eal_flags_file_prefix_autotest MALLOC_PERTURB_=192
/root/dpdk/x86_64-native-linuxapp-gcc/app/test/dpdk-test
--file-prefix=eal_flags_file_prefix_autotest -a 31:00.0 -a 31:00.1
4. Execute the following command in the dpdk directory,the test result will
PASS:
DPDK_TEST=eal_flags_file_prefix_autotest MALLOC_PERTURB_=192
/root/dpdk/x86_64-native-linuxapp-gcc/app/test/dpdk-test
--file-prefix=eal_flags_file_prefix_autotest -a 31:00.0 -a 31:00.1 -a b1:00.0
-a b1:00.1
[Show the output from the previous commands]
1.Test Results of Step 3:
EAL: Probe PCI driver: net_ice (8086:1592) device: 0000:b1:00.1 (socket 1)
ice_load_pkg_type(): Active package is: 1.3.30.0, ICE OS Default Package
(double VLAN mode)
Error - hugepage files for memtest1 were not deleted!
Test Failed
2.Test Results of Step 4:
EAL: Failed to open VFIO group 184
EAL: Requested device 0000:b1:00.0 cannot be used
EAL: Cannot open /dev/vfio/185: Device or resource busy
EAL: Failed to open VFIO group 185
EAL: Requested device 0000:b1:00.1 cannot be used
Test OK
[Expected Result]
Explain what is the expected result in text or as an example output:
Test OK
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