[DPDK/core Bug 1427] BPF jit test errors on Arm

[bugzilla at dpdk.org]

https://bugs.dpdk.org/show_bug.cgi?id=1427

            Bug ID: 1427
           Summary: BPF jit test errors on Arm
           Product: DPDK
           Version: 24.03
          Hardware: ARM
                OS: All
            Status: UNCONFIRMED
          Severity: normal
          Priority: Normal
         Component: core
          Assignee: dev at dpdk.org
          Reporter: stephen at networkplumber.org
  Target Milestone: ---

In test log, saw these errors in BPF JIT when running bpf_convert_autotest.
Looks like bug in ARM JIT that is being silently ignored.

EAL: Detected CPU lcores: 32
EAL: Detected NUMA nodes: 1
EAL: Detected static linkage of DPDK
EAL: Multi-process socket /var/run/dpdk/rte/mp_socket
EAL: Selected IOVA mode 'VA'
EAL: Probe PCI driver: net_virtio (1af4:1041) device: 0000:01:00.0 (socket -1)
eth_virtio_pci_init(): Failed to init PCI device
EAL: Requested device 0000:01:00.0 cannot be used
APP: HPET is not enabled, using TSC as default timer
BPF: bpf_exec(0xffff87fc2000): division by 0 at pc: 0x68;
BPF: emit(0xffff87fc2000): invalid opcode 0x30 at pc: 1;
BPF: __rte_bpf_jit(0xffff87fc2000) failed, error code: -22;
BPF: emit(0xffff87fc2000): invalid opcode 0x30 at pc: 1;
BPF: __rte_bpf_jit(0xffff87fc2000) failed, error code: -22;
BPF: emit(0xffff87fc2000): invalid opcode 0x30 at pc: 1;
BPF: __rte_bpf_jit(0xffff87fc2000) failed, error code: -22;
-------

  9/111 DPDK:fast-tests / bpf_convert_autotest  OK       0.28 s

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