[PATCH v4 3/3] test/graph: fix graph autotest second run test failure

[Stephen Hemminger]

On Thu, 14 Nov 2024 14:38:06 +0530
<kirankumark at marvell.com> wrote:

> From: Kiran Kumar K <kirankumark at marvell.com>
> 
> The graph autotest second run test is failing due to the
> node name is already present in the node list. Adding changes
> to free nodes at the time of test cleanup.
> 
> Fixes: 6b89650418fe ("test/graph: add functional tests")
> 
> Signed-off-by: Kiran Kumar K <kirankumark at marvell.com>
> ---
>  app/test/test_graph.c | 96 ++++++++++++++++++++++++++++++++++++++++---
>  1 file changed, 90 insertions(+), 6 deletions(-)
> 
> diff --git a/app/test/test_graph.c b/app/test/test_graph.c
> index 2840a25b13..e712dbebf7 100644
> --- a/app/test/test_graph.c
> +++ b/app/test/test_graph.c
> @@ -68,6 +68,8 @@ static void *mbuf_p[MAX_NODES + 1][MBUFF_SIZE];
>  static rte_graph_t graph_id;
>  static uint64_t obj_stats[MAX_NODES + 1];
>  static uint64_t fn_calls[MAX_NODES + 1];
> +static uint32_t dummy_nodes_id[MAX_NODES];
> +static int dummy_nodes_id_count;

Why is dummy_nodes_id_count signed? Can it ever be negative?
If not better to use unsigned or uint32_t