[dpdk-test-report] |SUCCESS| pw18044 [PATCH v3 05/12] eal: integrate bus scan and probe with EAL
checkpatch at dpdk.org
checkpatch at dpdk.org
Fri Dec 16 14:09:17 CET 2016
Test-Label: checkpatch
Test-Status: SUCCESS
http://dpdk.org/patch/18044
_coding style OK_
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