[dpdk-test-report] |SUCCESS| pw23516 [PATCH v5 03/12] eal: remove unused rte_eal_dev_init()

checkpatch at dpdk.org checkpatch at dpdk.org
Tue Apr 11 17:45:57 CEST 2017

Previous message: [dpdk-test-report] |SUCCESS| pw23515 [PATCH v5 02/12] eal: move virtual device probing into a bus
Next message: [dpdk-test-report] |SUCCESS| pw23517 [PATCH v5 04/12] eal: Refactor vdev driver probe/remove
Messages sorted by: [ date ] [ thread ] [ subject ] [ author ]

Test-Label: checkpatch
Test-Status: SUCCESS
http://dpdk.org/patch/23516

_coding style OK_

Previous message: [dpdk-test-report] |SUCCESS| pw23515 [PATCH v5 02/12] eal: move virtual device probing into a bus
Next message: [dpdk-test-report] |SUCCESS| pw23517 [PATCH v5 04/12] eal: Refactor vdev driver probe/remove
Messages sorted by: [ date ] [ thread ] [ subject ] [ author ]

More information about the test-report mailing list