[dpdk-test-report] |SUCCESS| pw85981 [PATCH v2 1/2] test/bitmap: test scan after half cline is cleared

checkpatch at dpdk.org checkpatch at dpdk.org
Tue Jan 5 09:58:59 CET 2021

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Test-Label: checkpatch
Test-Status: SUCCESS
http://dpdk.org/patch/85981

_coding style OK_

Previous message (by thread): [dpdk-test-report] |SUCCESS| pw(85980) [v7, 4/4] examples/ifpga: add example for opae ifpga API
Next message (by thread): [dpdk-test-report] |SUCCESS| pw85982 [PATCH v2 2/2] bitmap: modify bitmap not empty API for 128B cacheline
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