|FAILURE| pw162820-162821 [PATCH] [v1,2/2] net/iavf: reuse device al

[dpdklab at iol.unh.edu]

Test-Label: iol-intel-Functional
Test-Status: FAILURE
https://dpdk.org/patch/162821

_Functional Testing issues_

Submitter: Soumyadeep Hore <soumyadeep.hore at intel.com>
Date: Thursday, April 02 2026 15:21:37 
DPDK git baseline: Repo:dpdk-next-net-intel
  Branch: master
  CommitID:0e093f95276d0a152abcdd373dd580bd4e07e7f5

162820-162821 --> functional testing issues

Upstream job id: Template-DPDK-DTS-Pipeline#8272

Test environment and result as below:

Ubuntu 24.04
Kernel: 6.8
Compiler: gcc gcc (Ubuntu 13.3.0-6ubuntu2~24.04.1) 13.3.0
NIC: Intel Corporation 4xxx Series QAT 0 Mbps

Aggregate Results by Test Suite
+----------------------+--------+
|      Test Suite      | Result |
+======================+========+
| cryptodev_throughput |  FAIL  |
+----------------------+--------+


To view detailed results, visit:
https://lab.dpdk.org/results/dashboard/patchsets/35657/

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