|SUCCESS| pw172102 [PATCH v2 02/16] drivers/bus: fix FD leak during scan in NXP drivers

checkpatch at dpdk.org checkpatch at dpdk.org
Mon Oct 26 19:12:34 CET 2026

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Test-Label: checkpatch
Test-Status: SUCCESS
http://dpdk.org/patch/172102

_coding style OK_

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Next message (by thread): |SUCCESS| pw172101 [PATCH v2 01/16] drivers/bus: cleanup device freeing in NXP bus scan
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