[dpdk-dev] [PATCH 1/7] event/octeontx: move eventdev octeontx test to driver

[Pavan Nikhilesh Bhagavatula]

On Wed, Dec 13, 2017 at 10:34:28AM +0000, Bruce Richardson wrote:
> On Wed, Dec 13, 2017 at 10:19:51AM +0000, Van Haaren, Harry wrote:
> > > -----Original Message-----
> > > From: Pavan Nikhilesh [mailto:pbhagavatula at caviumnetworks.com]
> > > Sent: Tuesday, December 12, 2017 7:27 PM
> > > To: jerin.jacob at caviumnetworks.com; Richardson, Bruce
> > > <bruce.richardson at intel.com>; Van Haaren, Harry
> > > <harry.van.haaren at intel.com>; Eads, Gage <gage.eads at intel.com>;
> > > hemant.agrawal at nxp.com; nipun.gupta at nxp.com; Ma, Liang J
> > > <liang.j.ma at intel.com>
> > > Cc: dev at dpdk.org; Pavan Nikhilesh <pbhagavatula at caviumnetworks.com>
> > > Subject: [dpdk-dev] [PATCH 1/7] event/octeontx: move eventdev octeontx test
> > > to driver
> > >
> > > Move octeontx eventdev specific test (test_eventdev_octeontx.c) to
> > > driver/event/octeontx.
> >
> > <snip patch content>
> >
> > Replying to 1st patch, as no cover letter;
> >
> > Summary of patchset:
> > - Move tests for a specific Eventdev PMD into the PMD dir: drivers/event/x/x_selftest.c
> > - Enable self tests to run when passed the vdev arg "self-test=1"
> >
> >
> > A few comments on this change;
> >
> > 1) We should not lose the capability to run tests as part of the existing unit testing infrastructure. We should not fragment the testing tool - requiring multiple binaries to test a single component.
> >
> > From discussion on #IRC, it seems reasonable to call  rte_eal_vdev_init()  with "self-test=1" from the test/test/ code, and then we can continue to use the existing test infrastructure despite that the actual tests are now part of each PMD.
> >
> > 2) We should not copy/paste TEST_ASSERT macros into new test files. Abstracting the TEST_ASSERT and other macros out to a header file would solve this duplication.
> >
> >
> > Specific comments will be sent as replies to the patches. Cheers, -Harry
>
> What I gather from a cursory glance at this set is that the self tests
> are designed to be triggered via devargs to the device driver, correct?
> I'm not sure I like this approach, though I do agree with having the
> tests inside the individual drivers.
>
> What I think I would prefer to see is the self-tests being called via an
> API rather than via devargs. I think we should add a
> "rte_event_dev_self_test()" API to the eventdev library, and have that
> then call into the driver-provided tests. This means that self-tests can
> only be called by applications which are set up to allow the tests to be
> called, e.g. the autotest binary, while also avoiding the issue of
> having lots of driver specifics clutter up test binaries.

Agreed, will modify it to ops based scheme so that application can call driver
specific `event_dev_self_test` and register selftest in
test/test/test_eventdev.c.

Although we would like to retain devargs selftest scheme for event_octeontx. I
will remove it for event_sw. Does that sound good?

>
> Regards,
> /Bruce

Regards,
Pavan