[dpdk-dev] [PATCH 1/7] event/octeontx: move eventdev octeontx test to driver

Bruce Richardson bruce.richardson at intel.com
Wed Dec 13 12:39:54 CET 2017


On Wed, Dec 13, 2017 at 04:54:29PM +0530, Pavan Nikhilesh Bhagavatula wrote:
> On Wed, Dec 13, 2017 at 10:34:28AM +0000, Bruce Richardson wrote:
> > On Wed, Dec 13, 2017 at 10:19:51AM +0000, Van Haaren, Harry wrote:
> > > > -----Original Message-----
> > > > From: Pavan Nikhilesh [mailto:pbhagavatula at caviumnetworks.com]
> > > > Sent: Tuesday, December 12, 2017 7:27 PM
> > > > To: jerin.jacob at caviumnetworks.com; Richardson, Bruce
> > > > <bruce.richardson at intel.com>; Van Haaren, Harry
> > > > <harry.van.haaren at intel.com>; Eads, Gage <gage.eads at intel.com>;
> > > > hemant.agrawal at nxp.com; nipun.gupta at nxp.com; Ma, Liang J
> > > > <liang.j.ma at intel.com>
> > > > Cc: dev at dpdk.org; Pavan Nikhilesh <pbhagavatula at caviumnetworks.com>
> > > > Subject: [dpdk-dev] [PATCH 1/7] event/octeontx: move eventdev octeontx test
> > > > to driver
> > > >
> > > > Move octeontx eventdev specific test (test_eventdev_octeontx.c) to
> > > > driver/event/octeontx.
> > >
> > > <snip patch content>
> > >
> > > Replying to 1st patch, as no cover letter;
> > >
> > > Summary of patchset:
> > > - Move tests for a specific Eventdev PMD into the PMD dir: drivers/event/x/x_selftest.c
> > > - Enable self tests to run when passed the vdev arg "self-test=1"
> > >
> > >
> > > A few comments on this change;
> > >
> > > 1) We should not lose the capability to run tests as part of the existing unit testing infrastructure. We should not fragment the testing tool - requiring multiple binaries to test a single component.
> > >
> > > From discussion on #IRC, it seems reasonable to call  rte_eal_vdev_init()  with "self-test=1" from the test/test/ code, and then we can continue to use the existing test infrastructure despite that the actual tests are now part of each PMD.
> > >
> > > 2) We should not copy/paste TEST_ASSERT macros into new test files. Abstracting the TEST_ASSERT and other macros out to a header file would solve this duplication.
> > >
> > >
> > > Specific comments will be sent as replies to the patches. Cheers, -Harry
> >
> > What I gather from a cursory glance at this set is that the self tests
> > are designed to be triggered via devargs to the device driver, correct?
> > I'm not sure I like this approach, though I do agree with having the
> > tests inside the individual drivers.
> >
> > What I think I would prefer to see is the self-tests being called via an
> > API rather than via devargs. I think we should add a
> > "rte_event_dev_self_test()" API to the eventdev library, and have that
> > then call into the driver-provided tests. This means that self-tests can
> > only be called by applications which are set up to allow the tests to be
> > called, e.g. the autotest binary, while also avoiding the issue of
> > having lots of driver specifics clutter up test binaries.
> 
> Agreed, will modify it to ops based scheme so that application can call driver
> specific `event_dev_self_test` and register selftest in
> test/test/test_eventdev.c.
> 
> Although we would like to retain devargs selftest scheme for event_octeontx. I
> will remove it for event_sw. Does that sound good?
> 

Sure, sounds good to me.

Thanks,
/Bruce


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