[dpdk-dev] [PATCH 3/3] app/test: add unit tests for eal vfio

Burakov, Anatoly anatoly.burakov at intel.com
Thu Aug 22 12:57:41 CEST 2019

On 22-Aug-19 8:18 AM, Chaitanya Babu, TalluriX wrote:
> Hi Aaron,
>> -----Original Message-----
>> From: Aaron Conole [mailto:aconole at redhat.com]
>> Sent: Wednesday, August 21, 2019 9:15 PM
>> To: Chaitanya Babu, TalluriX <tallurix.chaitanya.babu at intel.com>
>> Cc: dev at dpdk.org; Pattan, Reshma <reshma.pattan at intel.com>;
>> Parthasarathy, JananeeX M <jananeex.m.parthasarathy at intel.com>;
>> Burakov, Anatoly <anatoly.burakov at intel.com>
>> Subject: Re: [dpdk-dev] [PATCH 3/3] app/test: add unit tests for eal vfio
>> Chaitanya Babu Talluri <tallurix.chaitanya.babu at intel.com> writes:
>>> Unit test cases are added for eal vfio library.
>>> eal_vfio_autotest added to meson build file.
>>> Signed-off-by: Chaitanya Babu Talluri
>>> <tallurix.chaitanya.babu at intel.com>
>>> ---
>> Thanks for adding unit tests for the vfio library.
>> In this case, there seems to be some failures - can you help determine the
>> cause:
> As per log we observed
> "EAL:   VFIO support not initialized"
> Can you Please check if device is binded or not with vfio-pci.
> If device is not binded we might get this error (EAL:   VFIO support not initialized).
> We have binded the device and observed the tests are running fine as expected.
>> https://travis-ci.com/ovsrobot/dpdk/jobs/227066776

The test should be skipped if VFIO if VFIO is not initialized. I think 
we have an API for that, although it is not meant to be used by 
application code.


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