[dpdk-dev] [PATCH 3/3] app/test: add unit tests for eal vfio

[Burakov, Anatoly]

On 22-Aug-19 8:18 AM, Chaitanya Babu, TalluriX wrote:
> Hi Aaron,
> 
>> -----Original Message-----
>> From: Aaron Conole [mailto:aconole at redhat.com]
>> Sent: Wednesday, August 21, 2019 9:15 PM
>> To: Chaitanya Babu, TalluriX <tallurix.chaitanya.babu at intel.com>
>> Cc: dev at dpdk.org; Pattan, Reshma <reshma.pattan at intel.com>;
>> Parthasarathy, JananeeX M <jananeex.m.parthasarathy at intel.com>;
>> Burakov, Anatoly <anatoly.burakov at intel.com>
>> Subject: Re: [dpdk-dev] [PATCH 3/3] app/test: add unit tests for eal vfio
>>
>> Chaitanya Babu Talluri <tallurix.chaitanya.babu at intel.com> writes:
>>
>>> Unit test cases are added for eal vfio library.
>>> eal_vfio_autotest added to meson build file.
>>>
>>> Signed-off-by: Chaitanya Babu Talluri
>>> <tallurix.chaitanya.babu at intel.com>
>>> ---
>>
>> Thanks for adding unit tests for the vfio library.
>>
>> In this case, there seems to be some failures - can you help determine the
>> cause:
>>
> As per log we observed
> "EAL:   VFIO support not initialized"
> 
> Can you Please check if device is binded or not with vfio-pci.
> If device is not binded we might get this error (EAL:   VFIO support not initialized).
> 
> We have binded the device and observed the tests are running fine as expected.
> 
>> https://travis-ci.com/ovsrobot/dpdk/jobs/227066776
> 

The test should be skipped if VFIO if VFIO is not initialized. I think 
we have an API for that, although it is not meant to be used by 
application code.

-- 
Thanks,
Anatoly