[dpdk-dev] [PATCH 3/3] app/test: add unit tests for eal vfio
aconole at redhat.com
Thu Aug 22 16:40:36 CEST 2019
"Burakov, Anatoly" <anatoly.burakov at intel.com> writes:
> On 22-Aug-19 8:18 AM, Chaitanya Babu, TalluriX wrote:
>> Hi Aaron,
>>> -----Original Message-----
>>> From: Aaron Conole [mailto:aconole at redhat.com]
>>> Sent: Wednesday, August 21, 2019 9:15 PM
>>> To: Chaitanya Babu, TalluriX <tallurix.chaitanya.babu at intel.com>
>>> Cc: dev at dpdk.org; Pattan, Reshma <reshma.pattan at intel.com>;
>>> Parthasarathy, JananeeX M <jananeex.m.parthasarathy at intel.com>;
>>> Burakov, Anatoly <anatoly.burakov at intel.com>
>>> Subject: Re: [dpdk-dev] [PATCH 3/3] app/test: add unit tests for eal vfio
>>> Chaitanya Babu Talluri <tallurix.chaitanya.babu at intel.com> writes:
>>>> Unit test cases are added for eal vfio library.
>>>> eal_vfio_autotest added to meson build file.
>>>> Signed-off-by: Chaitanya Babu Talluri
>>>> <tallurix.chaitanya.babu at intel.com>
>>> Thanks for adding unit tests for the vfio library.
>>> In this case, there seems to be some failures - can you help determine the
>> As per log we observed
>> "EAL: VFIO support not initialized"
>> Can you Please check if device is binded or not with vfio-pci.
>> If device is not binded we might get this error (EAL: VFIO support not initialized).
>> We have binded the device and observed the tests are running fine as expected.
> The test should be skipped if VFIO if VFIO is not initialized.
+1 - not every developer will have that set up for their systems. And
for those developers building drive-by patches, we shouldn't make the
unit tests unusable.
> I think
> we have an API for that, although it is not meant to be used by
> application code.
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