[dpdk-dev] [PATCH 2/2] test/meson: hash lf test moved to dpdk perf testsuite

[Wang, Yipeng1]

>-----Original Message-----
>From: agupta3 at marvell.com [mailto:agupta3 at marvell.com]
>Sent: Thursday, September 5, 2019 10:50 PM
>To: Wang, Yipeng1 <yipeng1.wang at intel.com>; Gobriel, Sameh <sameh.gobriel at intel.com>; Richardson, Bruce
><bruce.richardson at intel.com>; De Lara Guarch, Pablo <pablo.de.lara.guarch at intel.com>
>Cc: dev at dpdk.org; Amit Gupta <agupta3 at marvell.com>
>Subject: [PATCH 2/2] test/meson: hash lf test moved to dpdk perf testsuite
>
>From: Amit Gupta <agupta3 at marvell.com>
>
>hash_readwrite_lf test always getting TIMEOUT as required
>time to finish this test was much longer compare to time
>required for fast tests(10s). Hence, the test is being
>moved to perf test category for its execution to complete.
>
>Signed-off-by: Amit Gupta <agupta3 at marvell.com>
>---
> app/test/meson.build | 2 +-
> 1 file changed, 1 insertion(+), 1 deletion(-)
>
>diff --git a/app/test/meson.build b/app/test/meson.build
>index 94fd9f8..34141c5 100644
>--- a/app/test/meson.build
>+++ b/app/test/meson.build
>@@ -220,7 +220,6 @@ fast_test_names = [
>         'eventdev_common_autotest',
>         'fbarray_autotest',
>         'hash_readwrite_func_autotest',
>-        'hash_readwrite_lf_autotest',
>         'ipsec_autotest',
>         'kni_autotest',
>         'kvargs_autotest',
>@@ -263,6 +262,7 @@ perf_test_names = [
>         'stack_lf_perf_autotest',
>         'rand_perf_autotest',
>         'hash_readwrite_perf_autotest',
>+        'hash_readwrite_lf_autotest',
> ]
>
> driver_test_names = [
>--
>1.8.3.1
 [Wang, Yipeng] 
I believe the lf_autotest includes functional test as well which is critical for testing the lock free implementation on non-TSO machine.
Do you think it is possible to also separate this test?
I also include the ARM folks for opinions.

Thanks!
Yipeng