[dpdk-dev] [PATCH] eal: change the log level for test assert macro
David Marchand
david.marchand at redhat.com
Thu Jul 16 17:06:58 CEST 2020
On Wed, Jul 15, 2020 at 10:20 PM Honnappa Nagarahalli
<honnappa.nagarahalli at arm.com> wrote:
>
> Change the log level for RTE_TEST_ASSERT macro to error to help
> log errors while running test cases.
>
> Signed-off-by: Honnappa Nagarahalli <honnappa.nagarahalli at arm.com>
> ---
> lib/librte_eal/include/rte_test.h | 2 +-
> 1 file changed, 1 insertion(+), 1 deletion(-)
>
> diff --git a/lib/librte_eal/include/rte_test.h b/lib/librte_eal/include/rte_test.h
> index 89e47f47a..62c8f165a 100644
> --- a/lib/librte_eal/include/rte_test.h
> +++ b/lib/librte_eal/include/rte_test.h
> @@ -18,7 +18,7 @@
>
> #define RTE_TEST_ASSERT(cond, msg, ...) do { \
> if (!(cond)) { \
> - RTE_LOG(DEBUG, EAL, "Test assert %s line %d failed: " \
> + RTE_LOG(ERR, EAL, "Test assert %s line %d failed: " \
> msg "\n", __func__, __LINE__, ##__VA_ARGS__); \
> RTE_TEST_TRACE_FAILURE(__FILE__, __LINE__, __func__); \
> return -1; \
> --
> 2.17.1
>
I proposed it, so I can't disagree :-)
RTE_TEST_ASSERT* are used in eventdev driver selftests.
I don't see why more output in error cases would be detrimental.
Any objection?
Thanks.
--
David Marchand
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