[dpdk-dev] [PATCH] eal: change the log level for test assert macro

[Honnappa Nagarahalli]

<snip>

> Subject: Re: [PATCH] eal: change the log level for test assert macro
> 
> On Wed, Jul 15, 2020 at 10:20 PM Honnappa Nagarahalli
> <honnappa.nagarahalli at arm.com> wrote:
> >
> > Change the log level for RTE_TEST_ASSERT macro to error to help log
> > errors while running test cases.
> >
> > Signed-off-by: Honnappa Nagarahalli <honnappa.nagarahalli at arm.com>
> > ---
> >  lib/librte_eal/include/rte_test.h | 2 +-
> >  1 file changed, 1 insertion(+), 1 deletion(-)
> >
> > diff --git a/lib/librte_eal/include/rte_test.h
> > b/lib/librte_eal/include/rte_test.h
> > index 89e47f47a..62c8f165a 100644
> > --- a/lib/librte_eal/include/rte_test.h
> > +++ b/lib/librte_eal/include/rte_test.h
> > @@ -18,7 +18,7 @@
> >
> >  #define RTE_TEST_ASSERT(cond, msg, ...) do {                                  \
> >         if (!(cond)) {                                                        \
> > -               RTE_LOG(DEBUG, EAL, "Test assert %s line %d failed: "         \
> > +               RTE_LOG(ERR, EAL, "Test assert %s line %d failed: "           \
> >                                 msg "\n", __func__, __LINE__, ##__VA_ARGS__); \
> >                 RTE_TEST_TRACE_FAILURE(__FILE__, __LINE__, __func__);         \
> >                 return -1;                                                    \
> > --
> > 2.17.1
> >
> 
> I proposed it, so I can't disagree :-)
Forgot to add you to suggested-by. Fixed it in v2 😊

> 
> RTE_TEST_ASSERT* are used in eventdev driver selftests.
> I don't see why more output in error cases would be detrimental.
> Any objection?
> 
> Thanks.
> 
> --
> David Marchand