[dpdk-dev] [PATCH] eal: change the log level for test assert macro

[Lukasz Wojciechowski]

W dniu 15.07.2020 o 22:20, Honnappa Nagarahalli pisze:
> Change the log level for RTE_TEST_ASSERT macro to error to help
> log errors while running test cases.
>
> Signed-off-by: Honnappa Nagarahalli <honnappa.nagarahalli at arm.com>
> ---
>   lib/librte_eal/include/rte_test.h | 2 +-
>   1 file changed, 1 insertion(+), 1 deletion(-)
>
> diff --git a/lib/librte_eal/include/rte_test.h b/lib/librte_eal/include/rte_test.h
> index 89e47f47a..62c8f165a 100644
> --- a/lib/librte_eal/include/rte_test.h
> +++ b/lib/librte_eal/include/rte_test.h
> @@ -18,7 +18,7 @@
>   
>   #define RTE_TEST_ASSERT(cond, msg, ...) do {                                  \
>   	if (!(cond)) {                                                        \
> -		RTE_LOG(DEBUG, EAL, "Test assert %s line %d failed: "         \
> +		RTE_LOG(ERR, EAL, "Test assert %s line %d failed: "           \
>   				msg "\n", __func__, __LINE__, ##__VA_ARGS__); \
>   		RTE_TEST_TRACE_FAILURE(__FILE__, __LINE__, __func__);         \
>   		return -1;                                                    \
Acked-by: Lukasz Wojciechowski <l.wojciechow at partner.samsung.com>

-- 
Lukasz Wojciechowski
Principal Software Engineer

Samsung R&D Institute Poland
Samsung Electronics
Office +48 22 377 88 25
l.wojciechow at partner.samsung.com