[PATCH 23.11] test/bpf: fix test specification in stable branches

[Marat Khalili]

Some BPF patches were backported with tests that use the newer test
specification keywords NOHUGE_OK and ASAN_OK. Previous DPDK releases
do not recognize these keywords and ignore these tests.

Replace NOHUGE_OK and ASAN_OK with the older boolean style (true, true)
to ensure these tests are correctly discovered and executed in the stable
branches.

Signed-off-by: Marat Khalili <marat.khalili at huawei.com>
---
* Rebased on v23.11.7-rc1
* Added --subject-prefix
* Added previously overlooked signed-off-by line.

 app/test/test_bpf.c | 24 ++++++++++++------------
 1 file changed, 12 insertions(+), 12 deletions(-)

diff --git a/app/test/test_bpf.c b/app/test/test_bpf.c
index 90ea881688..a1a16d0ea6 100644
--- a/app/test/test_bpf.c
+++ b/app/test/test_bpf.c
@@ -90,7 +90,7 @@ test_no_instructions(void)
 	return bpf_load_test(RTE_DIM(ins), ins, EINVAL);
 }
 
-REGISTER_FAST_TEST(bpf_no_instructions_autotest, NOHUGE_OK, ASAN_OK, test_no_instructions);
+REGISTER_FAST_TEST(bpf_no_instructions_autotest, true, true, test_no_instructions);
 
 /*
  * Try and load a BPF program comprising single EXIT instruction.
@@ -107,7 +107,7 @@ test_exit_only(void)
 	return bpf_load_test(RTE_DIM(ins), ins, EINVAL);
 }
 
-REGISTER_FAST_TEST(bpf_exit_only_autotest, NOHUGE_OK, ASAN_OK, test_exit_only);
+REGISTER_FAST_TEST(bpf_exit_only_autotest, true, true, test_exit_only);
 
 /*
  * Try and load a BPF program with no EXIT instruction.
@@ -127,7 +127,7 @@ test_no_exit(void)
 	return bpf_load_test(RTE_DIM(ins), ins, EINVAL);
 }
 
-REGISTER_FAST_TEST(bpf_no_exit_autotest, NOHUGE_OK, ASAN_OK, test_no_exit);
+REGISTER_FAST_TEST(bpf_no_exit_autotest, true, true, test_no_exit);
 
 /*
  * Try and load smallest possible valid BPF program.
@@ -149,7 +149,7 @@ test_minimal_working(void)
 	return bpf_load_test(RTE_DIM(ins), ins, 0);
 }
 
-REGISTER_FAST_TEST(bpf_minimal_working_autotest, NOHUGE_OK, ASAN_OK, test_minimal_working);
+REGISTER_FAST_TEST(bpf_minimal_working_autotest, true, true, test_minimal_working);
 
 /*
  * Try and load valid BPF program adding one to the argument.
@@ -177,7 +177,7 @@ test_add_one(void)
 	return bpf_load_test(RTE_DIM(ins), ins, 0);
 }
 
-REGISTER_FAST_TEST(bpf_add_one_autotest, NOHUGE_OK, ASAN_OK, test_add_one);
+REGISTER_FAST_TEST(bpf_add_one_autotest, true, true, test_add_one);
 
 /*
  * Try and load valid BPF program subtracting one from the argument.
@@ -205,7 +205,7 @@ test_subtract_one(void)
 	return bpf_load_test(RTE_DIM(ins), ins, 0);
 }
 
-REGISTER_FAST_TEST(bpf_subtract_one_autotest, NOHUGE_OK, ASAN_OK, test_subtract_one);
+REGISTER_FAST_TEST(bpf_subtract_one_autotest, true, true, test_subtract_one);
 
 /*
  * Conditionally jump over invalid operation as first instruction.
@@ -241,7 +241,7 @@ test_jump_over_invalid_first(void)
 	return bpf_load_test(RTE_DIM(ins), ins, EINVAL);
 }
 
-REGISTER_FAST_TEST(bpf_jump_over_invalid_first_autotest, NOHUGE_OK, ASAN_OK,
+REGISTER_FAST_TEST(bpf_jump_over_invalid_first_autotest, true, true,
 	test_jump_over_invalid_first);
 
 /*
@@ -284,7 +284,7 @@ test_jump_over_invalid_non_first(void)
 	return bpf_load_test(RTE_DIM(ins), ins, EINVAL);
 }
 
-REGISTER_FAST_TEST(bpf_jump_over_invalid_non_first_autotest, NOHUGE_OK, ASAN_OK,
+REGISTER_FAST_TEST(bpf_jump_over_invalid_non_first_autotest, true, true,
 	test_jump_over_invalid_non_first);
 
 /*
@@ -3631,7 +3631,7 @@ test_stack_alignment(void)
 	return TEST_SUCCESS;
 }
 
-REGISTER_FAST_TEST(bpf_stack_alignment_autotest, NOHUGE_OK, ASAN_OK, test_stack_alignment);
+REGISTER_FAST_TEST(bpf_stack_alignment_autotest, true, true, test_stack_alignment);
 
 /*
  * Test copying `__uint128_t`.
@@ -3687,7 +3687,7 @@ test_stack_copy_uint128(void)
 
 #endif
 
-REGISTER_FAST_TEST(bpf_stack_copy_uint128_autotest, NOHUGE_OK, ASAN_OK, test_stack_copy_uint128);
+REGISTER_FAST_TEST(bpf_stack_copy_uint128_autotest, true, true, test_stack_copy_uint128);
 
 /*
  * Test SSE2 load and store intrinsics.
@@ -3773,7 +3773,7 @@ test_stack_sse2(void)
 
 #endif
 
-REGISTER_FAST_TEST(bpf_stack_sse2_autotest, NOHUGE_OK, ASAN_OK, test_stack_sse2);
+REGISTER_FAST_TEST(bpf_stack_sse2_autotest, true, true, test_stack_sse2);
 
 /*
  * Run memcpy and rte_memcpy with various data sizes and offsets (unaligned and aligned).
@@ -3906,7 +3906,7 @@ test_stack_memcpy(void)
 	return TEST_SUCCESS;
 }
 
-REGISTER_FAST_TEST(bpf_stack_memcpy_autotest, NOHUGE_OK, ASAN_OK, test_stack_memcpy);
+REGISTER_FAST_TEST(bpf_stack_memcpy_autotest, true, true, test_stack_memcpy);
 
 #ifndef RTE_HAS_LIBPCAP
 
-- 
2.43.0