[PATCH 25.11] test/bpf: fix test specification in stable branches

[Marat Khalili]

Some BPF patches were backported with tests that use the newer test
specification keywords NOHUGE_OK and ASAN_OK. Previous DPDK releases
do not recognize these keywords and ignore these tests.

Replace NOHUGE_OK and ASAN_OK with the older boolean style (true, true)
to ensure these tests are correctly discovered and executed in the stable
branches.

Signed-off-by: Marat Khalili <marat.khalili at huawei.com>
---
* Added --subject-prefix
* Added previously overlooked signed-off-by line.

 app/test/test_bpf.c | 24 ++++++++++++------------
 1 file changed, 12 insertions(+), 12 deletions(-)

diff --git a/app/test/test_bpf.c b/app/test/test_bpf.c
index c95efed299..ec5acdbdfc 100644
--- a/app/test/test_bpf.c
+++ b/app/test/test_bpf.c
@@ -91,7 +91,7 @@ test_no_instructions(void)
 	return bpf_load_test(RTE_DIM(ins), ins, EINVAL);
 }
 
-REGISTER_FAST_TEST(bpf_no_instructions_autotest, NOHUGE_OK, ASAN_OK, test_no_instructions);
+REGISTER_FAST_TEST(bpf_no_instructions_autotest, true, true, test_no_instructions);
 
 /*
  * Try and load a BPF program comprising single EXIT instruction.
@@ -108,7 +108,7 @@ test_exit_only(void)
 	return bpf_load_test(RTE_DIM(ins), ins, EINVAL);
 }
 
-REGISTER_FAST_TEST(bpf_exit_only_autotest, NOHUGE_OK, ASAN_OK, test_exit_only);
+REGISTER_FAST_TEST(bpf_exit_only_autotest, true, true, test_exit_only);
 
 /*
  * Try and load a BPF program with no EXIT instruction.
@@ -128,7 +128,7 @@ test_no_exit(void)
 	return bpf_load_test(RTE_DIM(ins), ins, EINVAL);
 }
 
-REGISTER_FAST_TEST(bpf_no_exit_autotest, NOHUGE_OK, ASAN_OK, test_no_exit);
+REGISTER_FAST_TEST(bpf_no_exit_autotest, true, true, test_no_exit);
 
 /*
  * Try and load smallest possible valid BPF program.
@@ -150,7 +150,7 @@ test_minimal_working(void)
 	return bpf_load_test(RTE_DIM(ins), ins, 0);
 }
 
-REGISTER_FAST_TEST(bpf_minimal_working_autotest, NOHUGE_OK, ASAN_OK, test_minimal_working);
+REGISTER_FAST_TEST(bpf_minimal_working_autotest, true, true, test_minimal_working);
 
 /*
  * Try and load valid BPF program adding one to the argument.
@@ -178,7 +178,7 @@ test_add_one(void)
 	return bpf_load_test(RTE_DIM(ins), ins, 0);
 }
 
-REGISTER_FAST_TEST(bpf_add_one_autotest, NOHUGE_OK, ASAN_OK, test_add_one);
+REGISTER_FAST_TEST(bpf_add_one_autotest, true, true, test_add_one);
 
 /*
  * Try and load valid BPF program subtracting one from the argument.
@@ -206,7 +206,7 @@ test_subtract_one(void)
 	return bpf_load_test(RTE_DIM(ins), ins, 0);
 }
 
-REGISTER_FAST_TEST(bpf_subtract_one_autotest, NOHUGE_OK, ASAN_OK, test_subtract_one);
+REGISTER_FAST_TEST(bpf_subtract_one_autotest, true, true, test_subtract_one);
 
 /*
  * Conditionally jump over invalid operation as first instruction.
@@ -242,7 +242,7 @@ test_jump_over_invalid_first(void)
 	return bpf_load_test(RTE_DIM(ins), ins, EINVAL);
 }
 
-REGISTER_FAST_TEST(bpf_jump_over_invalid_first_autotest, NOHUGE_OK, ASAN_OK,
+REGISTER_FAST_TEST(bpf_jump_over_invalid_first_autotest, true, true,
 	test_jump_over_invalid_first);
 
 /*
@@ -285,7 +285,7 @@ test_jump_over_invalid_non_first(void)
 	return bpf_load_test(RTE_DIM(ins), ins, EINVAL);
 }
 
-REGISTER_FAST_TEST(bpf_jump_over_invalid_non_first_autotest, NOHUGE_OK, ASAN_OK,
+REGISTER_FAST_TEST(bpf_jump_over_invalid_non_first_autotest, true, true,
 	test_jump_over_invalid_non_first);
 
 /*
@@ -3646,7 +3646,7 @@ test_stack_alignment(void)
 	return TEST_SUCCESS;
 }
 
-REGISTER_FAST_TEST(bpf_stack_alignment_autotest, NOHUGE_OK, ASAN_OK, test_stack_alignment);
+REGISTER_FAST_TEST(bpf_stack_alignment_autotest, true, true, test_stack_alignment);
 
 /*
  * Test copying `__uint128_t`.
@@ -3702,7 +3702,7 @@ test_stack_copy_uint128(void)
 
 #endif
 
-REGISTER_FAST_TEST(bpf_stack_copy_uint128_autotest, NOHUGE_OK, ASAN_OK, test_stack_copy_uint128);
+REGISTER_FAST_TEST(bpf_stack_copy_uint128_autotest, true, true, test_stack_copy_uint128);
 
 /*
  * Test SSE2 load and store intrinsics.
@@ -3788,7 +3788,7 @@ test_stack_sse2(void)
 
 #endif
 
-REGISTER_FAST_TEST(bpf_stack_sse2_autotest, NOHUGE_OK, ASAN_OK, test_stack_sse2);
+REGISTER_FAST_TEST(bpf_stack_sse2_autotest, true, true, test_stack_sse2);
 
 /*
  * Run memcpy and rte_memcpy with various data sizes and offsets (unaligned and aligned).
@@ -3921,7 +3921,7 @@ test_stack_memcpy(void)
 	return TEST_SUCCESS;
 }
 
-REGISTER_FAST_TEST(bpf_stack_memcpy_autotest, NOHUGE_OK, ASAN_OK, test_stack_memcpy);
+REGISTER_FAST_TEST(bpf_stack_memcpy_autotest, true, true, test_stack_memcpy);
 
 #ifdef TEST_BPF_ELF_LOAD
 
-- 
2.43.0